Scanning Electron Microscopy Analysis
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Abstract
Scanning electron microscopy (SEM) uses high-energy electron beam to bombard the material surface, and collect and magnify the excited information to produce images. SEM can quickly provide high-resolution and high-depth-of-field images to study the surface and near-surface structure of the materials. SEM is excellent in generating detailed surface topography images. When combined with an auxiliary Energy Dispersive X-ray Spectroscopy detector, SEM can be used to obtain the morphology, particle size distribution, semi quantitative element and so on.
STEMart provides scanning electron microscopy service for failure analysis, dimensional analysis, process characterization, reverse engineering and particle identification.
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